Download Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: by Manoj Sachdev,José Pineda de Gyvez PDF

By Manoj Sachdev,José Pineda de Gyvez

The 2nd version of illness orientated checking out has been greatly up to date. New chapters on sensible, Parametric disorder types and Inductive fault research and Yield Engineering were additional to supply a hyperlink among disorder assets and yield. The bankruptcy on RAM checking out has been up-to-date with specialize in parametric and SRAM balance checking out. equally, more moderen fabric has been included in electronic fault modeling and analog trying out chapters. The energy of disorder orientated trying out for nano-Metric CMOS VLSIs lies in its business relevance.

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